1 - 5 of 5 results for "Cher Ming Tan"

Title: Electromigration In Ulsi Interconnections, Author: Cher Ming Tan
Hardcover $85.57 $105.00 Current price is $85.57, Original price is $105.00.
Title: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections, Author: Cher Ming Tan
Title: Theory and Practice of Quality and Reliability Engineering in Asia Industry, Author: Cher Ming Tan
Title: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections / Edition 1, Author: Cher Ming Tan
Hardcover $127.99 $159.99 Current price is $127.99, Original price is $159.99.
Title: Electromigration Modeling at Circuit Layout Level, Author: Cher Ming Tan