1 - 3 of 3 results for "Zhenghao Gan"

Title: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections, Author: Cher Ming Tan
Title: Semiconductor Process Reliability in Practice, Author: Juin J. Liou
Title: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections / Edition 1, Author: Cher Ming Tan
Hardcover $107.84 $159.99 Current price is $107.84, Original price is $159.99.